Re: The embedded gear is often based on very low-power hardware
Besides libraries, some chips with a "High-quality Random Number Generator" fail 50% of the DieHarder test suite.
Another problem is that the certificates in question could be generated at the factory, right when the device is turned on, with no entropy available because it's on an isolated network with the test machine. Sure, with a tiny bit of work they could get around this, but they just don't do it.
