Re: @Hadrada - Thanks
" have a couple of books that cover a subset that - Wayne R. Moore's Foundations of Mechanical Accuracy for microelasticity, and Eric Marsh's Precision Spindle Metrology for capacitance micrometry in that setting - "
The book is a retrospective of his work. Key features of his approach were the use of unbalencing sensors driving null reading bridges. The first makes one output bigger as the other side gets smaller while the second keeps the scale quite short as all you need to know is wheather or not the reading is at zero.The system output is the error signal needed to cancel the sensor output.
Today such sensors can measure a 2000 tonne tank or powder silo to within 1Kg (1 parts in 2^21). They are also quite beautiful, being laser cut from a single piece of steel.
It's also good on the design of various flexure bearings that eliminate the sudden "jerk" when applied force overcomes static friction for the first time and an object starts to move.
This is stuff that's used in the design of semiconductor mfg equipment but a lot of Jones work comes from the 1950's. Being able to generated nm displacements by hand is very tricky, but his papers show how it's done.
Jones was active in WWII in what today would be called electronic warfare and ECM, which is a rather tenuous link the original topic.
Biting the hand that feeds IT
